Another example of a ceramic.
Ceramic dip package.
Kyocera offers a wide variety of standard ceramic packages including ceramic dual inline packages c dip ceramic small outline packages c sop ceramic pin grid array packages c pga ceramic quad flat packages c qfp ceramic quad flat j leaded packages c qfj and ceramic quad flat non leaded packages c qfn.
Eprom ics in 0 6 wide ceramic dip 40 dip 32 dip 28 dip 24 packages also known as cdip ceramic dip 8 contact dip switch with 0 3 wide 16 pin dip 16n footprint in microelectronics a dual in line package dip or dil 1 or dual in line pin package dipp 2 is an electronic component package with a rectangular housing and two.
Non standard dip with smaller 0 07 in 1 78 mm pin spacing.
Material properties process flow.
And having a row spacing associated with body width varies depending on lead counts with 0 3 in.
Minimum pin count is 28 while the maximum pin count is limited to the manufacturer s capabilities.
Packages come in many forms including dip dual inline sip single inline and pga pin grid array pin insertion types and surface mount types including j lead flat lead gull wing leadless bga ball grid array lga land grid array csp chip size package and other types.
Ceramic packages for large scale integration lsi devices.
Cerdip ceramic q ceramic dual inline package glass seal package drawing q filter packages by entering lead count or product description into the search box below.
The most commonly found ceramic dip packages have an inter lead spacing or lead pitch of 0 1 inch 2 54 mm.
Medical and healthcare.
Standard dip with 0 1 in 2 54 mm pin spacing rows 0 3 in 7 62 mm apart.
Like dip but with staggered zig zag pins.
Package outline material information.
Medical and healthcare.
Both passive or active devices may be found using ceramic packages.
Kyocera will present its ceramic packages at cioe 2018 china s most popular optoelectronics exhibition.
Ceramic substrates for probe cards.
Spst x 4 two complementary pairs per package.
14 lead cerdip q 14 pdf.
Standard packages and lids for device evaluation.